MarSurf VD Series for your Contour & Roughness measurements
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MarSurf VD Series, the new measuring station concept combines speed, reliability and flexibility that aims to increase the profitability of the system for your company. The measuring stations are operated with the user-friendly MarWin software.
The MarSurf family is complemented that provides easy change between roughness and contour tracing system of MarSurf VD Series. Depending on the measuring task, either the BFW roughness probe system for surface roughness or the C 11 contour probe system for contour measurements can be changed by the operator (hot-plug capable). The new system offers the advantages of combining the highly dynamic C 11 contour probe system with the high-precision BFW probe system, which is particularly suitable for fine surfaces.
l MarSurf VD Series: Features at a glance
- Automatic probe arm recognition
- Easy probe arm change due to the magnetic probe arm holder. No recalibration necessary.
- Large, flexible mounting plate with 50 mm grid
- Integrated TY axis in the supporting plate with 60 mm travel path
- Positioning speed up to 200 mm/s
- Fully automatic measuring sequences
- Can be optionally expanded for roughness evaluation
l Innovative technologies
1. Fast axes
- Positioning speeds up to 200 mm/s in X
- Contour measurements are 25 x faster than with its predecessor MarSurf PCV or MarSurf CD 120
- Surface measurements are 40 x faster than with the MarSurf GD 120
- By default, the Z-axis is fully CNC-capable
- The Z-axis is approx. twice as fast as previous Mahr Z-axes
- Up to 5 times faster than standard Z-axes on the market
2. Two reference probe systems for your measuring tasks
- Contour probe system C 11
- Probe arm recognition via integrated chip
- Standard measuring range up to 70 mm; Max. 100 mm with 490 mm probe arm length
- Magnetic probe arm holder, probe arm change without tools
- The touch probe combines robustness with dynamics
- Optional: Possibility to extend the roughness value determination to contours
- Roughness probe system BFW
- Easy probe arm change and probe arm protection by means of magnetic probe arm holder
- Probe arm mount allows the change from standard to transverse measurement without tools or adapter
- Extensions for the probe system possible
3. Innovative workpiece clamping system
- Mounting plate 390 x 430 mm with hole dimension 50 mm
- Integrated 60 mm TY adjustment
- The combination of mounting plate and integrated TY adjustment makes an additional XY table superfluous
- Low workpiece setup supports a favorable short measurement loop, which has a positive effect on the measurement results
l Technical Data
- Tracing length (Lt) : 0.01 - 140 mm and 0.01 - 280 mm
- Positioning speed : 0.02 - 200 mm/s
- Measuring speed : 0.02 - 10 mm/s
- Resolution in x : 0.01 µm (10 nm)
- Straightness : 0.125 µm / 60 mm
- Probe system
- Probe measuring range (w) : 70 mm (350 mm probe)
- Uncertainty : ± (0.25 + H/250) µm; H in mm
- Measuring force : 4 mN to 30 mN, adjustable with software
- Tracing direction : Z+ / Z
- Z Vertical axis Z : 350 mm or 600 m
- Vt : 0.02 - 50 mm/s
For more information, please contact
Mahr S.E.A. Co., Ltd.
Tel. +662-717-1050-2
Fax +662-717-1055
E-Mail: [email protected]
Website: www.mahr.com
Mahr S.E.A. Co., Ltd.
Tel. +662-717-1050-2
Fax +662-717-1055
E-Mail: [email protected]
Website: www.mahr.com